The 10th International Workshop on Radiation Effects on
Semiconductor Devices for Space Applications
Date: December 10(Mon) - 12(Wed), 2012
Place: Tsukuba, Ibaraki, Japan
Call for Papers
|Welcome to 10th RASEDA!!
The aim of the workshop is to provide a pleasant forum for the exchange of ideas on recent scientific and technical issues relating to the area of research and development of semiconductor devices used in the space environment. The workshop focuses on several special topics relevant to the radiation effects community, such as total dose effects in devices, single event phenomena, radiation hardening technologies and radiation effects in solar cells.
The 10th RASEDA will be held at the Tsukuba International Congress Center in Tsukuba, Japan from December 10 to 12, 2012.
Oct. 5 (Extended!!)
|Abstract Submission Deadline.
||Author Notification of Abstract Acceptance.
Technical Program of draft version will be available.
||Technical Program of official version will be available.
||Early Registration Deadline.
If you want to join to the JAXA tour in 3rd day of 10th RASEDA (Dec. 12), you MUST register before this date.
||Proceedings Submission Deadline.
Workshop Proceedings can be downloaded!! Please get it from "Download Proceedings" tag.
The password is sent to registrated participants by e-mail.
The paper version proceedings are not distributed. We will distribute electronic data only.
So, participants who want to see the proceedings on-site must pre-download it to his or her computer or must pre-print it.
The abstract submission deadline was extended!! ( Oct. 5, 2012 )
The 10th RASEDA special rate for OKURA Frontier Hotel Tsukuba stay is available!!
You can reserve the OKURA Frontier Hotel Tsukuba by using special rate from
1. Single Event Effects
2. Total Ionizing Dose and Displacement Damage Effects
3. Space Solar Cells and Related Materials
4. New Materials and Devices Designed by a New Concept
5. Space Environments
6. Facilities and Test Methods
7. Space Missions and On-orbit Experiments
8. Neutron Induced Single Event in Electrical Devices and Components
Kenneth A. Label (NASA/GSFC)
R. Harboe Sorensen
Dale McMorrow (NRL)
A. Virtanen (RADEF)
M. Yoshikawa (JAXA/ISAS)
E. Ibe (Hitachi)
K. Takashima (JAXA/ISAS)
C. Zimmermann (Astrium)
A. Zadeh (ESA)
T. Sekitani (Univ. of Tokyo)
Leif Scheick (JPL)
| Reliability Engineering Association of Japan (REAJ)
| The Institute of Electronics, Information and Communication Engineers (IEICE)
| The Japan Society of Applied Physics (JSAP)
| The Japan Society for Aeronautical and Space Sciences (JSASS)
| Atomic Energy Society of Japan (AESJ)